A remark on NIST SP 800-22 serial test

Corina-Elena Bogos; Razvan Mocanu; Emil Simion

Paper 2022/172

A remark on NIST SP 800-22 serial test

Corina-Elena Bogos, Razvan Mocanu, and Emil Simion

Abstract

This paper represents a cumulative review of the serial statistical test over the canonical values used in testing and freely generated values. Also in this paper, we study by simulation, the variation of second type error, depending on certain factors: the range of p1,the length of the bit string represented by n and the value of m-bit pattern.

Metadata

Available format(s): PDF
Category: Implementation
Publication info: Preprint. MINOR revision.
Keywords: pseudo-random generators serial test second type error
Contact author(s): corina iftinca v @ gmail com
esimion @ fmi unibuc ro
mocanurazvan123 @ gmail com
History: 2022-02-20: received
Short URL: https://ia.cr/2022/172
License: CC BY

BibTeX

@misc{cryptoeprint:2022/172,
      author = {Corina-Elena Bogos and Razvan Mocanu and Emil Simion},
      title = {A remark on NIST SP 800-22 serial test},
      howpublished = {Cryptology ePrint Archive, Paper 2022/172},
      year = {2022},
      note = {\url{https://eprint.iacr.org/2022/172}},
      url = {https://eprint.iacr.org/2022/172}
}